Optimization and passivation of HTS step-edge Josephson junction rf SQUIDs

Author

Du, Jia

Author_Institution

Telecommun. & Ind. Phys., CSIRO, Lindfield, NSW, Australia

Volume

13

Issue

2

fYear

2003

fDate

6/1/2003 12:00:00 AM

Firstpage

865

Lastpage

868

Abstract

In this work, various methods of improving the performance and yield of our step-edge junction rf SQUIDs are described. These methods include adjusting the YBCO thin film thickness and trimming of the device parameters by ion beam etching and heat annealing. Significant improvement in SQUID performance and yield was demonstrated by employing these techniques. The effects of passivation of the rf SQUIDs by ex-situ deposition of an amorphous-YBCO thin film were also studied. No adverse effects were observed for the noise performance of the devices due to passivation and long-term stability was obtained.

Keywords

Josephson effect; SQUIDs; annealing; barium compounds; high-temperature superconductors; passivation; sputter etching; superconducting device noise; superconducting thin films; yttrium compounds; HTS step-edge Josephson junction RF SQUID; YBCO thin film; YBaCuO; annealing; ion beam etching; noise spectrum; passivation; Annealing; Etching; High temperature superconductors; Ion beams; Josephson junctions; Passivation; SQUIDs; Sputtering; Thin film devices; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2003.814069

Filename

1211741