DocumentCode :
1237841
Title :
Physical design for 3D system on package
Author :
Lim, Sung Kyu
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
22
Issue :
6
fYear :
2005
Firstpage :
532
Lastpage :
539
Abstract :
The SoC paradigm is a system integration approach that integrates large numbers of transistors as well as various mixed-signal active and passive components onto a single chip. This realization-led to the 3D system-in-package (SiP) approach, alternatively called 3D ICs or 3D stacked die/package. Designers can take SiP a step further by embedding both active and passive components, but passive-component embedding is bulky and requires thick-film discrete components. Thick-film component embedding distinguishes SiP from system on package (SoP), an emerging 3D system integration concept that involves embedding both active and passive components. SoP, however, incorporates ultrathin films at microscale to embed the passive components, and the package rather than the board is the system. SoP overcomes both the computing and integration limitations of SoC, SiP, multichip modules (MCMs), and traditional system packaging by having global wiring as well as RF, digital, and optical component integration in the package instead of on the chip. Moreover, 3D SoP addresses the wire delay problem by enabling the replacement of long, slow global interconnects with short, fast vertical routes.
Keywords :
chip-on-board packaging; integrated circuit interconnections; system-in-package; 3D integrated circuit; 3D stacked package; 3D system on package; 3D system-in-package; active component; passive component; system integration; system packaging; thick-film discrete component; Analog integrated circuits; Arrayed waveguide gratings; Design automation; Digital integrated circuits; Electromagnetic interference; Integrated circuit interconnections; Nonhomogeneous media; Packaging; Radio frequency; Radiofrequency integrated circuits; 3D packaging; System-On-Package; crosstalk; decoupling capacitors; placement and routing; thermal distribution;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2005.149
Filename :
1541915
Link To Document :
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