Abstract :
This newsletter provides information on past and upcoming events related to the IEEE Computer Society´s Test Technology Technical Council and the test community.
Keywords :
ATS; DFT; ETS; IMS3TW; IOLTS; NDCS; TTTC; WRTLT; test technology;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2008.86
