DocumentCode :
1237889
Title :
Influence of charging energy on Cooper pair tunneling in Bi-2212 small intrinsic Josephson junctions
Author :
Kawae, T. ; Yasuda, T. ; Kim, S.-J. ; Nakajima, K. ; Yamashita, T.
Volume :
13
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
897
Lastpage :
900
Abstract :
We have investigated the properties of submicron intrinsic Josephson junctions (IJJs) fabricated on Bi2Sr2CaCu2O8+δ liquid phase epitaxy film. The IJJs with junction area S<2 μm2 showed individual current-voltage curves, which have suppressed 1st branch and unsuppressed other branches. This suppression was observed systematically as an increase the ratio of charging energy and Josephson coupling energy. It is expected that such suppressions are due to charging effect in IJJs.
Keywords :
Cooper pairs; Josephson effect; bismuth compounds; calcium compounds; high-temperature superconductors; liquid phase epitaxial growth; strontium compounds; superconducting epitaxial layers; superconductive tunnelling; Bi-2212 small intrinsic Josephson junctions; Bi2Sr2CaCu2O8+δ; Cooper pair tunneling; Josephson coupling energy; charging energy; high temperature superconductor; individual current-voltage curves; liquid phase epitaxy film; Bismuth; Epitaxial growth; Etching; Fabrication; High temperature superconductors; Josephson junctions; Strontium; Substrates; Superconducting films; Tunneling;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2003.814074
Filename :
1211749
Link To Document :
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