Title :
Ultrafast carrier dynamics in optically excited YBa2Cu3O7-δ thin films diagnosed by a pump-and-probe terahertz experiment
Author :
Wald, Hagen ; Seidel, Paul ; Tonouchi, Masayoshi
Author_Institution :
Inst. fur Festkorperphysik, Friedrich-Schiller-Univ., Jena, Germany
fDate :
6/1/2003 12:00:00 AM
Abstract :
A pump-and-probe terahertz emission technique is reported to investigate the nonequilibrium process of ultrafast generation and relaxation of hot quasiparticles and their recombination to form Cooper pairs in superconducting YBa2Cu3O7-δ thin films following femtosecond laser excitation. Subpicosecond electromagnetic pulses emitted by an YBa2Cu3O7-δ microbridge change after an excitation of the material due to an additional laser pulse, the so-called pump pulse. The modulation of the emitted terahertz pulse amplitude is used to measure the time resolved evaluation of the hot carrier excitation and relaxation after a time delay to the pump laser pulse. The results are compared to terahertz pump-and-probe experiments on GaAs photoswitches and can be explained by avalanche Cooper pair breaking, supercurrent modulation followed by carrier acceleration and Cooper pair recombination accompanied with deceleration of the supercurrent carriers.
Keywords :
Cooper pairs; barium compounds; carrier lifetime; carrier mobility; high-temperature superconductors; superconducting thin films; time resolved spectra; yttrium compounds; YBa2Cu3O7-δ; avalanche Cooper pair breaking; carrier acceleration; femtosecond laser excitation; high temperature superconductor; hot carrier excitation; hot carrier relaxation; hot quasiparticles; nonequilibrium process; optically excited YBa2Cu3O7-δ thin films; pump-and-probe terahertz experiment; subpicosecond electromagnetic pulses; supercurrent modulation; ultrafast carrier dynamics; EMP radiation effects; Laser excitation; Optical films; Optical pulses; Optical pumping; Pulse measurements; Pulse modulation; Pump lasers; Stimulated emission; Ultrafast optics;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.814129