• DocumentCode
    1238320
  • Title

    Nb-based superconducting tunnel junctions as submillimeter-wave direct detectors

  • Author

    Ariyoshi, Seiichiro ; Matsuo, Hiroshi ; Otani, Chiko ; Sato, Hiromi ; Shimizu, Hirohiko ; Matsunaga, Teruhiko ; Noguchi, Takashi

  • Author_Institution
    Graduate Univ. for Adv. Studies, Kanagawa, Japan
  • Volume
    13
  • Issue
    2
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    1128
  • Lastpage
    1131
  • Abstract
    Employing an anodization method into our fabrication process, we have successfully fabricated STJs with size of 4 μm in diameter, Josephson critical current density of 1000 A/cm2, low leakage current of less than 10 pA at 0.3 K and high fabrication yield of more than 90 percent. These STJs were applied to fabricate submillimeter-wave direct detectors using 12 linearly distributed junctions, each circular junction having a current density of 600 A/cm2 and size of 4 μm in diameter. Direct detection of submillimeter-waves was measured using a Fourier transform spectrometer, which shows a maximum sensitivity at 440 GHz and a fractional bandwidth of 10 percent.
  • Keywords
    Fourier transform spectroscopy; anodisation; critical current density (superconductivity); focal planes; leakage currents; radioastronomical techniques; submillimetre wave detectors; superconducting junction devices; superconducting microwave devices; 0.3 K; 4 micron; 440 GHz; Fourier transform spectrometer; Josephson critical current density; STJs; anodization method; circular junction; current density; fabrication yield; focal plane array; fractional bandwidth; leakage current; linearly distributed junctions; submillimeter-wave direct detectors; superconducting tunnel junctions; Bandwidth; Critical current density; Current density; Detectors; Fabrication; Fourier transforms; Josephson junctions; Leakage current; Spectroscopy; Submillimeter wave measurements;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2003.814172
  • Filename
    1211805