• DocumentCode
    1238341
  • Title

    Low-threshold-current-density vertical-cavity surface-emitting AlGaAs/GaAs diode lasers

  • Author

    Botez, D. ; Zinkiewicz, L.M. ; Roth, T.J. ; Mawst, L.J. ; Peterson, G.

  • Author_Institution
    TRW Space & Technol. Group, Redondo Beach, CA, USA
  • Volume
    1
  • Issue
    8
  • fYear
    1989
  • Firstpage
    205
  • Lastpage
    208
  • Abstract
    The optimization of electrically pumped vertical-cavity surface emitters (VCSEs) with conductive semiconductor-stack rear reflectors and mirror-reflectivity products of 0.93 for minimum threshold current density, J/sub th/, is presented. Devices of two different active layer thicknesses are fabricated: 3 mu m, as for conventional devices, and 0.6 mu m, which, according to theoretical calculations, provides J/sub th/ for lasers with a mirror reflectivity product in the 0.90-0.95 range. For structures of 0.16- mu m thick active layers, J/sub th/ values as low as 10 kA/cm/sup 2/ are obtained, in good agreement with theory. Analysis shows that for active layer thicknesses >
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; laser cavity resonators; semiconductor junction lasers; AlGaAs-GaAs diode lasers; active layer thicknesses; conductive semiconductor-stack rear reflectors; double-heterostructure devices; electrically pumped vertical-cavity surface emitters; minimum threshold current density; mirror-reflectivity products; multiquantum-well structure devices; thin active medium structures; Dielectric substrates; Diode lasers; Etching; Gallium arsenide; Optical arrays; Reflectivity; Semiconductor laser arrays; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.36043
  • Filename
    36043