• DocumentCode
    1238891
  • Title

    Investigation of the Nonthermal Mechanism of Efficiency Rolloff in InGaN Light-Emitting Diodes

  • Author

    Yang, Yi ; Cao, Xian An ; Yan, Chunhui

  • Author_Institution
    Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV
  • Volume
    55
  • Issue
    7
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    1771
  • Lastpage
    1775
  • Abstract
    We present a comparative study on the optical characteristics of InGaN-based multiple quantum well light-emitting diodes (LEDs) with peak emission ranging from green to ultraviolet (UV) over a wide injection range. It is found that by pulsing the LEDs with a duty cycle that is below 1%, thermally induced peak red shift and efficiency reduction are largely eliminated. The current dependence of both the quantum efficiency and peak shift appears to be a strong function of the indium content in the active region. The quantum efficiencies of the blue and green LEDs peak at very low currents and dramatically decrease at high currents, whereas the UV LED has a nearly constant quantum efficiency under high injection conditions. In contrast to the minimal current- induced energy shift in the UV LED, a monotonic blue shift of the peak energy, which has a total amount of ~110 meV-1 kA/cm2, is seen for the green LED. These results offer a strong support for the argument that the current overflow from localized states is the major nonthermal mechanism underlying the efficiency rolloff in InGaN-based visible LEDs.
  • Keywords
    III-V semiconductors; indium compounds; light emitting diodes; quantum well devices; wide band gap semiconductors; InGaN; electron volt energy 110 meV; light emitting diodes; nonthermal mechanism; quantum efficiency; quantum well; Aluminum gallium nitride; Fluorescence; Fluorescent lamps; Gallium nitride; Indium; LED lamps; Light emitting diodes; Lighting; Quantum well devices; Stimulated emission; Electroluminescence (EL); light-emitting diode (LED); nonthermal mechanism; quantum efficiency;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2008.923561
  • Filename
    4534859