DocumentCode :
123898
Title :
Critical Path Tracing Based Simulation of Transition Delay Faults
Author :
Kousaar, Jaak ; Ubar, Raimund ; Devadze, Sergei ; Raik, Jaan
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
fYear :
2014
fDate :
27-29 Aug. 2014
Firstpage :
108
Lastpage :
113
Abstract :
A new method is presented for simulating of transition delay faults (TDF). The main idea of the method is to extend the TDF model, traditionally considered as a class of robustly tested delay faults, to a class of TDFs with extended detection conditions. Three known fault classes of delay fault sensitization are considered: robust, non-robust and functional sensitization of delay faults. Additionally, a new fault class is introduced, called non-robust functionally sensitized delay fault. A novel fault analysis algorithm based on 7-valued algebra is presented, which delivers the fault coverage for all mentioned four types of TDFs.
Keywords :
algebra; critical path analysis; delays; fault diagnosis; fault simulation; 7-valued algebra; TDF simulation; critical path tracing; delay fault testing; extended detection conditions; fault analysis algorithm; nonrobust functionally sensitized delay fault; transition delay fault; Algebra; Circuit faults; Delays; Integrated circuit modeling; Logic gates; Robustness; Solid modeling; 7-valued algebra; critical path fault tracing; non-robust and functional sensitization; transition delay faults;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design (DSD), 2014 17th Euromicro Conference on
Conference_Location :
Verona
Type :
conf
DOI :
10.1109/DSD.2014.17
Filename :
6927233
Link To Document :
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