Title :
Photo-Stability Measurement of Electro-Optic Polymer Waveguides With High Intensity at 1550-nm Wavelength
Author :
Takahashi, Satsuki ; Bhola, Bipin ; Yick, Andrew ; Steier, William H. ; Luo, Jingdong ; Jen, Alex K Y ; Jin, Dan ; Dinu, Raluca
Author_Institution :
Univ. of Southern California, Los Angeles, CA
fDate :
4/15/2009 12:00:00 AM
Abstract :
Photo-stability measurements of electro-optic polymer inverted ridge waveguides, fabricated from AJ-CKL1, AJ416 and LPD-80, are conducted up to 30, 100, and 100 mW of input power coupled into the waveguides respectively. These experiments are performed in a N2 atmosphere to exclude absorbed O2. AJ416 and LPD-80 are found to be stable up to at least 1 MW/cm2 at 1550 nm. In contrast, photo-degradation was observed in an ambient atmosphere with 1 mW (LPD-80) and 10 mW (AJ-CKL1) coupled into the waveguides.
Keywords :
electro-optical devices; optical fabrication; optical polymers; optical testing; optical waveguides; ridge waveguides; AJ-CKL1; AJ416; LPD-80; electro-optic polymer waveguide; inverted ridge waveguide; photo-degradation; photo-stability measurement; power 1 mW; power 10 mW; wavelength 1550 nm; Atmosphere; Atmospheric measurements; Electrooptic devices; Electrooptical waveguides; Optical polymers; Optical waveguides; Power measurement; Stability; Temperature sensors; Wavelength measurement; Optical polymers; optical waveguides; photo-degradation; photo-stability;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2008.2011500
