Title :
Design of an Embedded Health Monitoring Infrastructure for Accessing Multi-processor SoC Degradation
Author :
Yong Zhao ; Kerkhoff, Hans G.
Author_Institution :
Testable Design & Test of Integrated Syst. (TDT) Group, Univ. of Twente, Enschede, Netherlands
Abstract :
An embedded health-monitoring infrastructure for a highly reliable MP-SoC for data-streaming systems is presented. Different from the traditional approach of a dependable design, our infrastructure is based on life-time prognostics from health-monitoring sensors that are embedded near the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. Focus of this paper is mainly the health-monitoring scheme and the sensor structure with simulation results.
Keywords :
intelligent sensors; monitoring; system-on-chip; MP-SoC; data-streaming system; embedded health monitoring infrastructure; health-monitoring sensor; multiprocessor SoC degradation; prognostics lifetime; Aging; Degradation; Monitoring; Reliability; Temperature measurement; Temperature sensors; Voltage measurement; MP-SoC; dependability testing; health-monitoring; nano electronics; prognostics; reliability sensor; repair;
Conference_Titel :
Digital System Design (DSD), 2014 17th Euromicro Conference on
Conference_Location :
Verona
DOI :
10.1109/DSD.2014.80
