• DocumentCode
    123904
  • Title

    Design of an Embedded Health Monitoring Infrastructure for Accessing Multi-processor SoC Degradation

  • Author

    Yong Zhao ; Kerkhoff, Hans G.

  • Author_Institution
    Testable Design & Test of Integrated Syst. (TDT) Group, Univ. of Twente, Enschede, Netherlands
  • fYear
    2014
  • fDate
    27-29 Aug. 2014
  • Firstpage
    154
  • Lastpage
    160
  • Abstract
    An embedded health-monitoring infrastructure for a highly reliable MP-SoC for data-streaming systems is presented. Different from the traditional approach of a dependable design, our infrastructure is based on life-time prognostics from health-monitoring sensors that are embedded near the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. Focus of this paper is mainly the health-monitoring scheme and the sensor structure with simulation results.
  • Keywords
    intelligent sensors; monitoring; system-on-chip; MP-SoC; data-streaming system; embedded health monitoring infrastructure; health-monitoring sensor; multiprocessor SoC degradation; prognostics lifetime; Aging; Degradation; Monitoring; Reliability; Temperature measurement; Temperature sensors; Voltage measurement; MP-SoC; dependability testing; health-monitoring; nano electronics; prognostics; reliability sensor; repair;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design (DSD), 2014 17th Euromicro Conference on
  • Conference_Location
    Verona
  • Type

    conf

  • DOI
    10.1109/DSD.2014.80
  • Filename
    6927239