DocumentCode
123904
Title
Design of an Embedded Health Monitoring Infrastructure for Accessing Multi-processor SoC Degradation
Author
Yong Zhao ; Kerkhoff, Hans G.
Author_Institution
Testable Design & Test of Integrated Syst. (TDT) Group, Univ. of Twente, Enschede, Netherlands
fYear
2014
fDate
27-29 Aug. 2014
Firstpage
154
Lastpage
160
Abstract
An embedded health-monitoring infrastructure for a highly reliable MP-SoC for data-streaming systems is presented. Different from the traditional approach of a dependable design, our infrastructure is based on life-time prognostics from health-monitoring sensors that are embedded near the target processor. This enables the preventive repair by spare parts or priority ranking of tasks among processors. Focus of this paper is mainly the health-monitoring scheme and the sensor structure with simulation results.
Keywords
intelligent sensors; monitoring; system-on-chip; MP-SoC; data-streaming system; embedded health monitoring infrastructure; health-monitoring sensor; multiprocessor SoC degradation; prognostics lifetime; Aging; Degradation; Monitoring; Reliability; Temperature measurement; Temperature sensors; Voltage measurement; MP-SoC; dependability testing; health-monitoring; nano electronics; prognostics; reliability sensor; repair;
fLanguage
English
Publisher
ieee
Conference_Titel
Digital System Design (DSD), 2014 17th Euromicro Conference on
Conference_Location
Verona
Type
conf
DOI
10.1109/DSD.2014.80
Filename
6927239
Link To Document