DocumentCode :
1239327
Title :
Free carrier effect on the refractive index change in quantum-well structures
Author :
Tomita, Akihisa
Author_Institution :
Opto-Electron. Res. Labs., NEC Corp., Ibaraki, Japan
Volume :
30
Issue :
12
fYear :
1994
fDate :
12/1/1994 12:00:00 AM
Firstpage :
2798
Lastpage :
2802
Abstract :
Dielectric response of spatially inhomogeneous free carriers in quantum wells is studied by random phase approximation (RPA) for a high frequency (near infrared) light field. A general form for susceptibilities is derived for a guided optical mode. The analysis shows that a conventional treatment (Drude model) for the TE mode provides a good approximation. The susceptibility for the TM mode is almost the same as that for the TE mode, in spite of quantization of carrier motion, as long as the photon energy is much larger than the intersubband transition energy. The free carrier component of the refractive index change in quantum-well waveguides is thus isotropic near the band gap. Carrier confinement will not reduce the free carrier component in the linewidth enhancement factor around the lasing wavelength
Keywords :
RPA calculations; laser modes; optical susceptibility; quantum well lasers; refractive index; waveguide lasers; Drude model; TE mode; TM mode; carrier confinement; carrier motion; dielectric response; free carrier component; free carrier effect; guided optical mode; high frequency light field; intersubband transition energy; lasing wavelength; linewidth enhancement factor; near infrared light field; quantization; quantum-well structures; quantum-well waveguides; random phase approximation; refractive index change; spatially inhomogeneous free carriers; susceptibilities; Dielectrics; Frequency; Optical refraction; Optical variables control; Optical waveguides; Quantization; Quantum wells; Refractive index; Tellurium; Waveguide components;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.362730
Filename :
362730
Link To Document :
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