• DocumentCode
    1239469
  • Title

    Systematic modal analysis of 3-D dielectric waveguides using conventional and high accuracy nonstandard FDTD algorithms

  • Author

    Tsakmakidis, Kosmas L. ; Hermann, Christian ; Klaedtke, Andreas ; Jamois, Cécile ; Hess, Ortwin

  • Author_Institution
    Sch. of Electron. & Phys. Sci., Univ. of Surrey, Guildford, UK
  • Volume
    17
  • Issue
    12
  • fYear
    2005
  • Firstpage
    2598
  • Lastpage
    2600
  • Abstract
    A robust methodology is presented for the accurate modal analysis of three-dimensional dielectric waveguides with the finite-difference time-domain (FDTD) method. We investigate the propagation of well-defined vector modes along strongly guiding rectangular waveguides. Eigensolutions of the vectorial wave equation are utilized in the simulations to accurately launch the fundamental and higher order eigenmodes. Results for their FDTD-computed propagation constant are found to be in excellent agreement with existing mode-solving techniques. Improved accuracy or significant computational savings are achieved when the nonstandard FDTD concepts are incorporated in the context of the present analysis.
  • Keywords
    eigenvalues and eigenfunctions; finite difference time-domain analysis; light propagation; modal analysis; optical planar waveguides; optical waveguide theory; rectangular waveguides; vectors; 3D dielectric waveguides; eigenmodes; eigensolutions; mode-solving techniques; nonstandard FDTD algorithms; propagation constant; strongly guiding rectangular waveguides; systematic modal analysis; vector mode propagation; vectorial wave equation; Computational modeling; Dielectrics; Electromagnetic waveguides; Finite difference methods; Laplace equations; Modal analysis; Optical waveguides; Rectangular waveguides; Robustness; Time domain analysis; Finite-difference time-domain (FDTD) method; modeling; nonstandard finite-difference (NSFD); optical waveguide;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2005.859174
  • Filename
    1542161