Title :
On Enhancing Fault Injection´s Capabilities and Performances for Safety Critical Systems
Author :
Di Carlo, S. ; Gambardella, Giulio ; Prinetto, P. ; Reichenbach, Frank ; Lokstad, Trond ; Rafiq, Gulzaib
Author_Institution :
Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
Abstract :
The increasing need for high-performance dependable systems with and the ongoing strong cost pressure leads to the adoption of commercial off-the-shelf devices, even for safety critical applications. Ad hoc techniques must be studied and implemented to develop robust systems and to validate the design against all safety requirements. Nonetheless, white-box fault injection relies on the deep knowledge of the system hardware architecture and it is seldom available to the designer. Furthermore it would require enormous simulation time to be carried out. This work presents an enhanced architecture for fast fault injection to be used for design-time coverage evaluation and runtime testing. A test case will be presented on Xilinx Zynq system on programmable chip, suitable for design-time diagnostic coverage evaluation and online testing for safety-critical systems resorting to the proposed fault injection methodology.
Keywords :
electronic engineering computing; fault diagnosis; field programmable gate arrays; program diagnostics; program testing; safety-critical software; system-on-chip; FPGA; Xilinx Zynq system; ad hoc techniques; commercial off-the-shelf devices; cost pressure; design-time coverage evaluation; design-time diagnostic coverage evaluation; fast fault injection methodology; fault injection capabilities; high-performance dependable systems; online testing; runtime testing; safety critical applications; safety requirements; safety-critical systems; system hardware architecture; system-on-programmable chip; white-box fault injection; Computer architecture; Hardware; Ports (Computers); Random access memory; Safety; Software; Testing; FPGA; dependability; diagnosis; fault injection; functional safety; safety; system-on-programmable-chip; testing;
Conference_Titel :
Digital System Design (DSD), 2014 17th Euromicro Conference on
Conference_Location :
Verona
DOI :
10.1109/DSD.2014.12