DocumentCode
1239596
Title
Differential Resistance Testing for InP-Based Semiconductor Optical Amplifiers
Author
Wieckowski, Michael ; Margala, Martin ; Hu, Martin H. ; Nguyen, Hong Ky
Author_Institution
Electr. Eng. & Comput. Sci. Dept., Univ. of Michigan, Ann Arbor, MI
Volume
27
Issue
7
fYear
2009
fDate
4/1/2009 12:00:00 AM
Firstpage
893
Lastpage
900
Abstract
A new method for electrically measuring optical performance degradation in InP-based semiconductor optical amplifiers (SOAs) is presented. It is shown that this degradation can be directly qualified through measurements of electrical subthreshold differential resistance. Experimental measurements are presented along with a theoretical analysis to demonstrate a proposed aging signature. Furthermore, two system designs are presented based on using this signature for enhancing device testability.
Keywords
ageing; laser reliability; semiconductor optical amplifiers; aging signature; differential resistance testing; laser reliability; semiconductor optical amplifiers; Aging; Degradation; Electric resistance; Electric variables measurement; Electrical resistance measurement; Semiconductor device testing; Semiconductor optical amplifiers; Stimulated emission; System analysis and design; System testing; Aging; reliability; semiconductor optical amplifiers; testing;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2008.922213
Filename
4814844
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