Title :
Differential Resistance Testing for InP-Based Semiconductor Optical Amplifiers
Author :
Wieckowski, Michael ; Margala, Martin ; Hu, Martin H. ; Nguyen, Hong Ky
Author_Institution :
Electr. Eng. & Comput. Sci. Dept., Univ. of Michigan, Ann Arbor, MI
fDate :
4/1/2009 12:00:00 AM
Abstract :
A new method for electrically measuring optical performance degradation in InP-based semiconductor optical amplifiers (SOAs) is presented. It is shown that this degradation can be directly qualified through measurements of electrical subthreshold differential resistance. Experimental measurements are presented along with a theoretical analysis to demonstrate a proposed aging signature. Furthermore, two system designs are presented based on using this signature for enhancing device testability.
Keywords :
ageing; laser reliability; semiconductor optical amplifiers; aging signature; differential resistance testing; laser reliability; semiconductor optical amplifiers; Aging; Degradation; Electric resistance; Electric variables measurement; Electrical resistance measurement; Semiconductor device testing; Semiconductor optical amplifiers; Stimulated emission; System analysis and design; System testing; Aging; reliability; semiconductor optical amplifiers; testing;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2008.922213
