• DocumentCode
    123965
  • Title

    Fault-Tolerant Irregular Topology Design Method for Network-on-Chips

  • Author

    Tosun, Suleyman ; Ajabshir, Vahid Babaei ; Mercanoglu, Ozge ; Ozturk, Ozcan

  • Author_Institution
    Comput. Eng. Dept., Ankara Univ., Ankara, Turkey
  • fYear
    2014
  • fDate
    27-29 Aug. 2014
  • Firstpage
    631
  • Lastpage
    634
  • Abstract
    As the technology sizes of integrated circuits (ICs) scale down rapidly, current transistor densities on chips dramatically increase. While nanometer feature sizes allow denser chip designs in each technology generation, fabricated ICs become more susceptible to wear-outs, causing operation failure. Even a single link failure within an on-chip fabric can halt communication between application blocks, which makes the entire chip useless. In this study, we aim to make faulty chips designed with Network-on-Chip (NoC) communication usable. Specifically, we present a fault-tolerant irregular topology generation method for application specific NoC designs. Designed NoC topology allows a different routing path if there is a link failure on the default routing. We compare fault-tolerant topologies with regular fault-tolerant ring topologies, and non-fault-tolerant application specific irregular topologies on energy consumption, performance, and area using multimedia benchmarks and custom-generated graphs.
  • Keywords
    fault tolerance; integrated circuit design; integrated circuit manufacture; integrated circuit technology; network routing; network topology; network-on-chip; IC technology sizes; NoC designs; application blocks; custom-generated graphs; default routing path; denser chip designs; energy consumption; fabricated IC; fault-tolerant irregular topology generation design method; fault-tolerant ring topology; faulty chips design; integrated circuit technology sizes; multimedia benchmarks; nanometer feature sizes; network-on-chip; nonfault-tolerant application; on-chip fabric; operation failure; single link failure; technology generation; transistor density; Energy consumption; Fault tolerance; Fault tolerant systems; Network topology; Ports (Computers); Routing; Topology; Fault tolerance; Network-on-Chip; energy; topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design (DSD), 2014 17th Euromicro Conference on
  • Conference_Location
    Verona
  • Type

    conf

  • DOI
    10.1109/DSD.2014.13
  • Filename
    6927300