• DocumentCode
    1239656
  • Title

    Study of the HTS coaxial cable models

  • Author

    Sytnikov, V.E. ; Dolgosheev, P.I. ; Polyakova, N.V. ; Svalov, G.G. ; Akimov, I.I. ; Boev, A.I. ; Ivanov, A.N. ; Keilin, V.E. ; Kovalev, I.A. ; Lelekhov, S.A. ; Novikov, S.I. ; Novikov, M.S. ; Shcherbakov, V.I.

  • Author_Institution
    JSC "VNIIKP" (Cable Inst.), Moscow, Russia
  • Volume
    13
  • Issue
    2
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    1934
  • Lastpage
    1937
  • Abstract
    The results of the experimental studies of the short HTS cable models with the length of 1.2 and 2.4 meters under the DC and AC modes are presented. The electrical resistance of the soldered and the mechanical joints between the copper current-lead and the superconducting tape layer and between the superconducting tape layers were studied. The internal conductor of these models has three layers twisted with the left direction and with various values of the twist pitch. The influences of the total current ramp rate, the model length and the value of the electrical resistance between the layers on the current redistribution in the cable model were experimentally studied. The results are in a good agreement with the theoretical results predicted earlier. Some cryogenics test results at different temperatures in the range of 65 K-78 K are presented also.
  • Keywords
    current distribution; high-temperature superconductors; power cable testing; superconducting cables; 1.2 m; 2.4 m; 65 to 78 K; AC modes; DC modes; HTS; coaxial cable models; cryogenics test results; current redistribution; electrical resistance; internal conductor; model length; soldered joints; superconducting power cable; superconducting tape layer; total current ramp rate; twist pitch; Coaxial cables; Conductors; Copper; Cryogenics; Electric resistance; High temperature superconductors; Superconducting cables; Superconducting films; Temperature distribution; Testing;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2003.812957
  • Filename
    1211990