Title :
Evaluation of a Second-Generation Ultra-Fast Energy-Resolved ASIC for Photon-Counting Spectral CT
Author :
Cheng Xu ; Persson, Mats ; Han Chen ; Karlsson, Staffan ; Danielsson, Mats ; Svensson, Christer ; Bornefalk, Hans
Author_Institution :
Dept. of Phys., AlbaNova Univ. Center, Stockholm, Sweden
Abstract :
A second-generation ultra-fast energy-resolved application specific integrated circuit (ASIC) has been developed for photon-counting spectral computed tomography (CT). The energy resolution, threshold dispersion and gain of the ASIC were characterized with synchrotron radiation at Diamond Light Source. The standard deviation of threshold offsets at zero keV is 0.89 keV. An RMS energy resolution of 1.09 keV has been demonstrated for 15 keV photon energy at a count rate of 40 kcps, and it deteriorates at a rate of 0.29 keV/Mcps with the increase of output cout rate. The count rate performance of the ASIC has also been evaluated with 120 kV polychromatic x-rays produced by a tungsten anode tube and the results are presented.
Keywords :
X-ray imaging; application specific integrated circuits; biomedical electronics; computerised tomography; photon counting; synchrotron radiation; RMS; diamond light source; electron volt energy 15 keV; energy resolution; photon-counting spectral CT; photon-counting spectral computed tomography; polychromatic X-rays; second-generation ultra-fast energy-resolved ASIC; second-generation ultrafast energy-resolved application specific integrated circuit; synchrotron radiation; tungsten anode tube; voltage 120 kV; Application specific integrated circuits; Detectors; Dispersion; Energy resolution; Photonics; Standards; Strips; ASIC; photon counting; silicon strip detector; spectral computed tomography; synchrotron;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2228276
