• DocumentCode
    1239989
  • Title

    Electron and proton radiation effects in the high temperature superconductor YBa2Cu3O7-δ

  • Author

    Summers, G.P. ; Chrisey, D.B. ; Maisch, W.G. ; Stauss, G.H. ; Burke, E.A. ; Nastasi, M. ; Tesmer, J.R.

  • Author_Institution
    US Naval Res. Lab., Washington, DC, USA
  • Volume
    36
  • Issue
    6
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    1840
  • Lastpage
    1847
  • Abstract
    The particle-induced depression of the superconducting critical temperature, Tc, of YBa2Cu3O 7-δ is shown to be directly proportional to the nonionizing energy loss (NIEL) of primary knock-on atoms (PKAs) displaced by incident electrons, protons, and heavy ions, which cover a NIEL range of over seven orders of magnitude. Calculations of the NIEL for electrons and protons are given for YBa2Cu3O 7 over the range 1-1000 MeV. The partition of NIEL among the elements as a function of incident electron energy is discussed. For a given particle fluence Φ, it is concluded that dTc /dΦ is proportional to the average number of defects produced, is not affected by the formation of defects in cascades, and is independent of the PKA spectrum. This means that the particle-induced depression of Tc can be predicted for any particle type, for any energy, and for any fluence
  • Keywords
    barium compounds; electron beam effects; high-temperature superconductors; proton effects; superconducting thin films; superconducting transition temperature; yttrium compounds; 1 to 1000 MeV; NIEL; PKA spectrum; YBa2Cu3O7-δ; cascades; defects; electron radiation effect; high temperature superconductor; nonionizing energy loss; primary knock-on atoms; proton radiation effects; superconducting critical temperature; Atomic measurements; Electrons; High temperature superconductors; Laboratories; Plasma temperature; Proton radiation effects; Prototypes; Space technology; Superconducting films; Superconducting materials;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.45377
  • Filename
    45377