Title :
On modeling crosstalk faults
Author :
Kundu, Sandip ; Zachariah, Sujit T. ; Chang, Yi-Shing ; Tirumurti, Chandra
Author_Institution :
Univ. of Massachusetts, Amherst, MA, USA
Abstract :
Traditionally, digital testing of integrated semiconductor circuits has focused on manufacturing defects. There is another class of failures that happens due to circuit marginalities. Circuit-marginality failures are on the rise due to shrinking process geometries, diminishing supply voltage, sharper signal-transition rates, and aggressive styles in circuit design. There are many different marginality issues that may render a circuit nonoperational. Capacitive cross coupling between interconnects is known to be a leading cause for marginality-related failures. In this paper, we present novel techniques to model and prioritize capacitive crosstalk faults. Experimental results are provided to show effectiveness of the proposed modeling technique on large industrial designs.
Keywords :
crosstalk; fault diagnosis; integrated circuit interconnections; integrated circuit modelling; integrated circuit testing; capacitive cross coupling; capacitive crosstalk fault; circuit design; circuit-marginality failure; crosstalk fault modeling; delay fault; digital testing; integrated semiconductor circuit; process geometry; signal-integrity testing; signal-transition rate; Circuit faults; Circuit synthesis; Circuit testing; Crosstalk; Geometry; Integrated circuit manufacture; Semiconductor device manufacture; Semiconductor device testing; Signal processing; Voltage; Capacitive crosstalk; delay fault; signal-integrity testing; testing;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2005.852670
