Title :
Bilayer Graphene Tunneling FET for Sub-0.2 V Digital CMOS Logic Applications
Author :
Agarwal, Tarun K. ; Nourbakhsh, Amirhasan ; Raghavan, Praveen ; Radu, Iuliana ; De Gendt, Stefan ; Heyns, Marc ; Verhelst, Marian ; Thean, A.
Author_Institution :
Dept. of Electr. Eng., Katholieke Univ. Leuven, Leuven, Belgium
Abstract :
We propose a bilayer graphene (BLG) tunneling field-effect-transistor (TFET) suitable for digital CMOS logic circuits. The ultimate performance limit of this structure is evaluated by solving the quantum transport equations in nonequilibrium Green´s function framework. A bandgap opening is induced in BLG using both vertical electric field and top-bottom asymmetric chemical doping. To overcome the limitations of nonabrupt p-i-n junctions using practical process methods, source/drain regions are created using work-function engineered metal-graphene contacts. We evaluate the performance of BLG-TFET by taking doping gradient due to contact induced doping into account. Our BLG-TFET exhibits a subthreshold slope as low as 35 mV/dec, and ION/IOFF as high as 2910 for a supply voltage of 0.2 V. The proposed BLG-TFET shows promise for ultralow-power applications, particularly in low to medium speed applications.
Keywords :
CMOS logic circuits; Green´s function methods; electric fields; field effect transistor circuits; graphene; integrated circuit design; semiconductor doping; semiconductor junctions; tunnelling; BLG tunneling field-effect-transistor; BLG-TFET; C; bandgap opening; bilayer graphene tunneling FET; digital CMOS logic applications; digital CMOS logic circuits; doping gradient; electric field; field effect transistor; medium speed applications; metal-graphene contacts; nonabrupt p-i-n junctions; nonequilibrium Green function; quantum transport equations; source-drain regions; top-bottom asymmetric chemical doping; ultralow-power applications; voltage 0.2 V; CMOS logic circuits; Doping; Graphene; Junctions; PIN photodiodes; Photonic band gap; Tunneling; Bilayer graphene; TFET; contact induced doping; digital CMOS logic;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2014.2364260