DocumentCode
1240654
Title
Reel-to-reel MOCVD for YBCO coated conductor
Author
Donet, S. ; Weiss, F. ; Chaudouet, P. ; Beauquis, S. ; Abrutis, A. ; Freyhardt, H.C. ; Usokin, A. ; Selbmann, D. ; Eickemeyer, J. ; Jimenez, C. ; Bruzek, C.E. ; Saugrain, J.M.
Author_Institution
LMGP-ENSPG, Saint Martin d´´Heres, France
Volume
13
Issue
2
fYear
2003
fDate
6/1/2003 12:00:00 AM
Firstpage
2524
Lastpage
2527
Abstract
A reel-to reel MOCVD system has been developed for a fast and economic process to get high quality YBCO coated conductor tapes. Several oxides buffer layer sequences (based on YSZ, CeO2, Y2O3...) were then grown epitaxially on two kinds of tape. Effective stacking for MOCVD reported here are YSZ/Y2O3/YBCO and YSZ/CeO2/YBCO, respectively, on oxidized Ni RABiTS microalloys (0,1% W) and on SS/YSZ (IBAD) tapes. First, EBSD and AFM techniques have been used to characterize the substrates. Superconducting YBCO films were fully characterized by SEM, XRD and AC susceptibility measurements Epitaxial growth was depicted with a strong in-plane and out-of plane texture: FWHM of YBCO φ-scans were 8.5° on Ni tape and 9° on IBAD Hastelloy tapes. High performances were also measured by AC susceptibility, with Jc values of 0.6 MA/cm2 at 77 K (0 T) on Ni tape and close to 1 MA/cm2 on IBAD substrates, with a sharp transition (ΔTc < 0.4 K) and a Tc onset at 90 K. Deposition of 2 meter buffered YSZ and CeO2/YBCO films have also been performed showing good in-plane alignment (φ-scan YSZ: FWHM = 11°) with a tape velocity set at 4 m/h.
Keywords
MOCVD coatings; X-ray diffraction; atomic force microscopy; barium compounds; cerium compounds; critical current density (superconductivity); high-temperature superconductors; magnetic susceptibility; scanning electron microscopy; superconducting epitaxial layers; superconducting tapes; vapour phase epitaxial growth; yttrium compounds; zirconium compounds; 2 m; 77 K; 90 K; AC susceptibility; AFM; EBSD; SEM; XRD; YBCO coated conductor; YBa2Cu3O7; YSZ/CeO2/YBCO; YSZ/Y2O3/YBCO; epitaxial growth; high temperature superconductor; in-plane alignment; oxides buffer layer sequences; oxidized Ni RABiTS microalloys; reel-to-reel MOCVD; stacking; Buffer layers; Conductors; MOCVD; Performance evaluation; Stacking; Substrates; Superconducting epitaxial layers; Superconducting films; X-ray scattering; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2003.811838
Filename
1212129
Link To Document