DocumentCode
1240736
Title
The generation lifetime damage factor and its variance in silicon
Author
Dale, C.J. ; Marshall, P.W. ; Burke, E.A. ; Summers, G.P. ; Bender, G.E.
Author_Institution
US Naval Res. Lab., Washington, DC, USA
Volume
36
Issue
6
fYear
1989
fDate
12/1/1989 12:00:00 AM
Firstpage
1872
Lastpage
1881
Abstract
The generation damage factor and its variance for silicon are determined for proton energies of 12, 22, and 63 MeV, and for fission neutrons. Measurement of the variance is made for the first time using 61504 pixels of a charge-injection device. The variance is an intrinsic characteristic of damage due in part to differences in numbers and magnitudes of atomic recoils produced in each pixel. Calculations of the variance due to the recoil spectrum show that the magnitude of the relative variance is determined by Coulombic recoils. In fact, the experimental relative variance is almost two orders of magnitude less for fission-neutron-induced dark current increases than for the proton case. The relative variance was found to decrease as the proton energy was increased. The calculation shows that this trend is caused by the inelastic contribution to the relative variance of the recoil spectrum
Keywords
CCD image sensors; carrier lifetime; neutron effects; proton effects; 12 MeV; 22 MeV; 63 MeV; Coulombic recoils; Si; atomic recoils; charge-injection device; dark current; fission neutrons; generation lifetime damage factor; proton energies; recoil spectrum; relative variance; semiconductor; Atomic measurements; Charge coupled devices; Dark current; Energy loss; Energy measurement; Fluctuations; Neutrons; Protons; Sensor arrays; Silicon;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.45381
Filename
45381
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