• DocumentCode
    1240736
  • Title

    The generation lifetime damage factor and its variance in silicon

  • Author

    Dale, C.J. ; Marshall, P.W. ; Burke, E.A. ; Summers, G.P. ; Bender, G.E.

  • Author_Institution
    US Naval Res. Lab., Washington, DC, USA
  • Volume
    36
  • Issue
    6
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    1872
  • Lastpage
    1881
  • Abstract
    The generation damage factor and its variance for silicon are determined for proton energies of 12, 22, and 63 MeV, and for fission neutrons. Measurement of the variance is made for the first time using 61504 pixels of a charge-injection device. The variance is an intrinsic characteristic of damage due in part to differences in numbers and magnitudes of atomic recoils produced in each pixel. Calculations of the variance due to the recoil spectrum show that the magnitude of the relative variance is determined by Coulombic recoils. In fact, the experimental relative variance is almost two orders of magnitude less for fission-neutron-induced dark current increases than for the proton case. The relative variance was found to decrease as the proton energy was increased. The calculation shows that this trend is caused by the inelastic contribution to the relative variance of the recoil spectrum
  • Keywords
    CCD image sensors; carrier lifetime; neutron effects; proton effects; 12 MeV; 22 MeV; 63 MeV; Coulombic recoils; Si; atomic recoils; charge-injection device; dark current; fission neutrons; generation lifetime damage factor; proton energies; recoil spectrum; relative variance; semiconductor; Atomic measurements; Charge coupled devices; Dark current; Energy loss; Energy measurement; Fluctuations; Neutrons; Protons; Sensor arrays; Silicon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.45381
  • Filename
    45381