• DocumentCode
    1240766
  • Title

    Correction of stray light and filter scratch blurring for ASTER imagery

  • Author

    Iwasaki, Akira ; Oyama, Eimei

  • Author_Institution
    Univ. of Tokyo, Japan
  • Volume
    43
  • Issue
    12
  • fYear
    2005
  • Firstpage
    2763
  • Lastpage
    2768
  • Abstract
    Stray light components in images obtained by the shortwave infrared (SWIR) and visible near-infrared (VNIR) radiometers of the Advanced Spaceborne Thermal Emission Reflection Radiometer (ASTER) were investigated. A simple method, which is equivalent to the van Cittert method of deconvolution, was used for correction. The stray light components were estimated using the image obtained during lunar observation, and the improvement in image quality was examined after stray light correction. The calculation is performed in the space domain, and application to the filter scratch problem of the ASTER/SWIR sensor, which has a scratch on the interference filter resulting in partially degenerated images, is also demonstrated.
  • Keywords
    data acquisition; deconvolution; filtering theory; geophysical signal processing; geophysical techniques; image restoration; infrared imaging; microwave measurement; radiometry; remote sensing; stray light; ASTER imagery; ASTER-SWIR sensor; Advanced Spaceborne Thermal Emission Reflection Radiometer; SWIR radiometer; VNIR radiometer; deconvolution; filter scratch blurring; image quality; interference filter; lunar observation; partially degenerated images; shortwave infrared radiometer; stray light components; stray light correction; van Cittert method; visible near-infrared radiometer; Deconvolution; Filters; Image quality; Image sensors; Infrared imaging; Interference; Moon; Optical reflection; Radiometers; Stray light; Advanced Spaceborne Thermal Emission Reflection Radiometer (ASTER); filter scratch; shortwave infrared (SWIR); stray light; visible near-infrared (VNIR);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/TGRS.2005.855065
  • Filename
    1542347