DocumentCode :
1241070
Title :
Time-dependence of ion charge State distributions of vacuum arcs: an interpretation involving atoms and charge exchange collisions
Author :
Anders, André
Author_Institution :
Lawrence Berkeley Nat. Lab., Univ. of California, Berkeley, CA, USA
Volume :
33
Issue :
1
fYear :
2005
Firstpage :
205
Lastpage :
209
Abstract :
Experimentally observed charge state distributions are known to be higher at the beginning of each arc discharge. Until know, this has been attributed to cathode surface effects in terms of changes in temperature, chemical composition, and spot mode. Here it is shown that the initial decay of charge states of cathodic arc plasmas may be at least in part due to charge exchange collisions of ions with neutrals. Neutrals gradually fill the discharge volume, and therefore, the effect of charge exchange shows delayed onset after arc initiation. Besides desorbed gases, sources of neutrals may include evaporated atoms from macroparticles and still-hot craters of previously active arc spots. More importantly, atoms are also produced by energetic condensation of the cathodic arc plasma. Self-sputtering is significant, and additionally, ions have a low sticking probability when impacting at oblique angle of incidence. Estimates show that the characteristic time for filling the discharge volume agrees well with the charge state decay time, and the likelihood of charge exchange is reasonably large to be taken into account.
Keywords :
charge exchange; chemical analysis; desorption; plasma chemistry; plasma collision processes; plasma temperature; vacuum arcs; cathode surface effects; cathodic arc plasmas; charge exchange collisions; charge state decay time; chemical composition; condensation; gas desorption; ion charge state distributions; self-sputtering; spot mode; vacuum arcs; Arc discharges; Cathodes; Chemicals; Delay effects; Fault location; Plasma chemistry; Plasma sources; Plasma temperature; Surface discharges; Vacuum arcs;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2004.841804
Filename :
1396145
Link To Document :
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