Title :
Growth by MOMBE of c-axis superconducting YBCO thin films on different substrates: in situ RHEED monitoring of the growth
Author :
Endo, K. ; Badica, P. ; Moriyasu, Y. ; Abe, K.
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Japan
fDate :
6/1/2003 12:00:00 AM
Abstract :
Superconducting YBCO c-axis oriented thin films have been grown by MOMBE (metalorganic molecular-beam-epitaxy). Growth of the films on different substrates [100] (Y,Nd)AlO3, [100] SrTiO3 and [100] MgO has been investigated by in situ monitoring the reflection high energy electron diffraction (RHEED). The paper discusses our results suggesting significant differences in films growth on the three presented substrates. The highest quality (high uniformity, epitaxy and low roughness) has been attained for the films prepared on SrTiO3. All films, regardless substrates, have shown values between 81 and 84 K for zero resistance critical temperature Tc0.
Keywords :
MOCVD coatings; barium compounds; high-temperature superconductors; molecular beam epitaxial growth; reflection high energy electron diffraction; superconducting epitaxial layers; superconducting transition temperature; yttrium compounds; (YNd)AlO3; 81 to 84 K; MOMBE; MgO; RHEED; SrTiO3; YBa2Cu3O7; [100] (Y,Nd)AlO3; [100] MgO; [100] SrTiO3; c-axis superconducting YBCO thin films; epitaxy; high temperature superconductor; high uniformity; low roughness; metalorganic molecular-beam-epitaxy; reflection high energy electron diffraction; zero resistance critical temperature; Electrons; Molecular beam epitaxial growth; Monitoring; Optical films; Reflection; Substrates; Superconducting epitaxial layers; Superconducting films; Superconducting thin films; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.812014
