• DocumentCode
    1241525
  • Title

    7-μm-cutoff PtSi infrared detector for high sensitivity MWIR applications

  • Author

    Lin, T.L. ; Park, J.S. ; Gunapala, S.D. ; Jones, E.W. ; Del Castillo, H.M. ; Weeks, M.M. ; Pellegrini, P.W.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    16
  • Issue
    3
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    94
  • Lastpage
    96
  • Abstract
    PtSi Schottky infrared detectors with extended cutoff wavelengths of 5.7, 6.6, and 7.3 μm have been demonstrated by incorporating a thin p+ layer at the PtSi-Si interface for high sensitivity medium wavelength infrared imaging applications. The response uniformity of the 7-μm cutoff detector was studied.
  • Keywords
    Schottky barriers; image sensors; infrared detectors; infrared imaging; platinum compounds; semiconductor-metal boundaries; sensitivity; 5.7 to 7.3 micron; PtSi infrared detector; PtSi-Si; Schottky IR detectors; extended cutoff wavelengths; high sensitivity MWIR applications; medium wavelength infrared imaging; response uniformity; thin p+ layer; Calibration; Dark current; Doping; Fabrication; Infrared detectors; Infrared imaging; Laboratories; Optical imaging; Space technology; Thermionic emission;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.363236
  • Filename
    363236
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1241525