Title :
X-ray photoelectron spectroscopy and magnetic force microscopy studies of ion-beam deposited Ni80Fe20/Co-oxide bilayers
Author :
Lin, Ko-Wei ; Lin, Fu-Tai ; Tzeng, Yi-Min
Author_Institution :
Dept. of Mater. Eng., Nat. Chung Hsing Univ., Taichung, Taiwan
Abstract :
The correlation between the structural and magnetic properties in Ni80Fe20/Co-oxide bilayers that were prepared using a dual-ion beam deposition technique has been investigated. The pure Permalloy (Ni80Fe20) film (a = 3.53 Å) consisted of face-centered cubic nanocrystallites. Films prepared with 8% O2 and 34% O2 in the assist beam consisted of rock-salt CoO (a = 4.27 Å) and spinel Co3O4 (a = 8.21 Å). The composition and oxidation state of the Co-oxide layers were analyzed with X-ray photoelectron spectroscopy (XPS), X-ray diffractometry (XRD), and transmission electron microscopy (TEM). Magnetic force microscopy (MFM) revealed that the Ni80Fe20/Co bilayer exhibited ripple domains, whereas cross-tie domain walls were found in Ni80Fe20/CoO bilayer. At 289 K, the pure Permalloy film exhibited soft magnetic properties while a magnetic hardening with enhanced coercivity was observed in the Ni80Fe20/CoO bilayer. Additionally, the Ni80Fe20/CoO bilayer exhibited an exchange shift Hex∼-75 Oe at 150 K.
Keywords :
Permalloy; X-ray diffraction; cobalt compounds; coercive force; ion beam assisted deposition; iron compounds; magnetic force microscopy; magnetic thin films; nickel compounds; photoelectron spectroscopy; transmission electron microscopy; 150 K; 289 K; Ni80Fe20-Co3O4; Ni80Fe20-CoO; X-ray diffractometry; X-ray photoelectron spectroscopy; cross-tie domain walls; dual-ion beam deposition; exchange coupling; face-centered cubic nanocrystallites; magnetic force microscopy; magnetic hardening; pure Permalloy film; ripple domains; rock-salt; transmission electron microscopy; Iron; Magnetic domain walls; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic properties; Oxidation; Photoelectron microscopy; Spectroscopy; Transmission electron microscopy; Exchange coupling; NiFe/Co-oxide bilayers; ion-beam deposition technique;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.842125