A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques-Part II: dielectric property recalculation

The use of combined embedded modulated scattering technique and near-field microwave nondestructive testing techniques is investigated as a novel method for evaluating the dielectric properties of a material. The forward formulation for determining the reflection coefficient at the aperture of a waveguide radiating into a dielectric half-space in which a PIN diode-loaded dipole (i.e., modulated scattering technique probe) is embedded was presented in Part I of this paper. Here, in Part II, the recalculation of the dielectric properties, using the results of the forward model, is presented along with some associated experimental results.