DocumentCode :
1242144
Title :
SEChecker: A Sequential Equivalence Checking Framework Based on {K} th Invariants
Author :
Lu, Feng ; Cheng, Kwang-Ting
Author_Institution :
Cadence Design Syst., Fremont, CA
Volume :
17
Issue :
6
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
733
Lastpage :
746
Abstract :
In recent years, considerable research efforts have been devoted to utilizing circuit structural information to improve the efficiency of Boolean satisfiability (SAT) solving, resulting in several efficient circuit-based SAT solvers. In this paper, we present a sequential equivalence checking framework based on a number of circuit-based SAT solving techniques as well as a novel invariant checker. We first introduce the notion of kth invariants. In contrast to the traditional invariants that hold for all cycles, k th invariants are guaranteed to hold only after the kth cycle from the initial state. We then present a bounded model checker (BMChecker) and an invariant checker (IChecker), both of which are based on circuit SAT techniques. Jointly, BMChecker and IChecker are used to compute the kth invariants, and are further integrated in a sequential circuit SAT solver for checking sequential equivalence. Experimental results demonstrate that the new sequential equivalence checking framework can efficiently verify large industrial designs that cannot be verified by existing solutions.
Keywords :
Boolean functions; formal verification; optimisation; sequential estimation; Boolean satisfiability; bounded model checker; circuit-based SAT solving techniques; invariant checker; kth invariants; sequential equivalence checking framework; Formal verification; invariant; sequential equivalence checking;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2008.2005311
Filename :
4815387
Link To Document :
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