Title :
Extended edge wave diffraction model for near-field directivity calculations of horn antennas
Author :
Odendaal, Johann W. ; Joubert, Johan ; Prinsloo, Mattheus J.
Author_Institution :
Dept. of Electr., Electron., & Comput. Eng., Univ. of Pretoria, South Africa
Abstract :
The edge wave diffraction model for pyramidal horn antennas is extended to include the finite radii of curvature of the primary incident wave approximated by an astigmatic ray tube in determining the edge diffraction fields contributing to the radiated fields. The model is adapted to calculate the effective near-field directivity of a pyramidal horn antenna for generating standard electromagnetic field strengths for the calibration of field probes. The predicted directivity results for a range of standard gain antennas are verified with method of moments data and measured values obtained in a near-field antenna range.
Keywords :
antenna radiation patterns; electromagnetic fields; electromagnetic wave diffraction; horn antennas; method of moments; astigmatic ray tube; edge diffraction field; edge wave diffraction model; electromagnetic field strength; field probe calibration; incident wave; method of moment; near-field antenna range; near-field directivity calculation; pyramidal horn antenna; radiated field; Adaptive arrays; Antenna measurements; Calibration; Electromagnetic diffraction; Electromagnetic fields; Electromagnetic modeling; Horn antennas; Measurement standards; Moment methods; Probes; Edge diffraction; horn antennas; near-field directivity;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.858141