DocumentCode
1242341
Title
The microstructure and microchemistry of high critical current Nb3Sn strands manufactured by the bronze, internal-Sn and PIT techniques
Author
Lee, P.J. ; Fischer, C.M. ; Naus, M.T. ; Squitieri, A.A. ; Larbalestier, D.C.
Author_Institution
Appl. Supercond. Center, Wisconsin Univ., Madison, WI, USA
Volume
13
Issue
2
fYear
2003
fDate
6/1/2003 12:00:00 AM
Firstpage
3422
Lastpage
3425
Abstract
Recent advances in Nb3Sn conductor development have advanced the non-Cu critical current density, Jc, from 2000 A/mm2 to almost 3000 A/mm2 (12 T, 4.2 K). We have quantified a variety of state of the art composites for their microstructures using the fracture/field emission scanning electron microscope, FESEM, technique and their microchemistry using energy dispersive X-ray spectroscopy (EDS)/FESEM. The results of the measurements increasingly point to the importance of A15 composition in determining the critical current density as well as grain size. The highest critical current densities, however, are being attained by the internal Sn process which has yet to achieve as high a level of Sn (23-24.5 at.% Sn) in the A15 as for powder-in-tube (PIT) in which we measure as high as 25-26 at.% Sn. When Sn diffuses into the Cu stabilizer, it is found to have a great affinity for Nb3Sn formation than dissolution into the Cu. A15 forms at the Nb-stabilizer surface with local Cu concentrations within the grains of the stabilizer of less than 0.1 at.% Cu. Elevated levels of Sn, however, were observed at the Cu grain boundaries. Both the quantified variations in composition and the peak levels of Sn indicate that further increases in performance should be expected.
Keywords
critical current density (superconductivity); critical currents; field emission electron microscopy; grain boundaries; grain size; multifilamentary superconductors; niobium alloys; scanning electron microscopy; self-diffusion; tin alloys; type II superconductors; 12 T; 4.2 K; A15 composition; EDS; FESEM; Nb3Sn; PIT technique; bronze technique; critical current density; diffusion; energy dispersive X-ray spectroscopy; fracture/field emission scanning electron microscopy; grain boundaries; grain size; high critical current Nb3Sn strands; internal-Sn technique; microchemistry; microstructure; Conductors; Critical current; Critical current density; Current measurement; Density measurement; Electron emission; Microstructure; Niobium; Scanning electron microscopy; Tin;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2003.812341
Filename
1212363
Link To Document