DocumentCode
1242701
Title
Numerical analysis of transverse mode in gain-guided vertical cavity surface emitting lasers
Author
Zhang, J.-P. ; Petermann, K.
Author_Institution
Inst. fur Hochfrequenztech., Tech. Univ. Berlin, Germany
Volume
142
Issue
1
fYear
1995
fDate
2/1/1995 12:00:00 AM
Firstpage
29
Lastpage
35
Abstract
The stability of the fundamental transverse mode in a multiquantum-well vertical cavity surface emitting laser (VSCEL) has been studied by simulation. A full self-consistent model is presented for the VCSELs including the refractive index and the gain changes due to temperature rise and carrier variation in the gain medium. The nonuniform finite difference method is employed to solve the two-dimensional wave equation and simulate the behaviour of the VCSELs on desktop computers. The limitation to the maximum single mode power stems from the appearance of the higher-order transverse mode for the broad-area lasers, and the gain reduction caused by heating the small-area lasers. The self-focusing resulting from the spatial hole burning has a strong impact on the fundamental mode size. The calculations show that there are optimum values for both the quantum-well number and the conductive path diameter. Based on the chosen parameters a laser with three quantum wells and about 6 μm diameter conductive path yields the largest single mode output power
Keywords
finite difference methods; laser beams; laser modes; laser stability; optical hole burning; optical self-focusing; quantum well lasers; refractive index; surface emitting lasers; 6 mum; broad-area lasers; carrier variation; conductive path; conductive path diameter; desktop computers; fundamental mode size; fundamental transverse mode; gain changes; gain medium; gain reduction; gain-guided vertical cavity surface emitting lasers; higher-order transverse mode; multiquantum-well vertical cavity surface emitting laser; nonuniform finite difference method; refractive index; self-consistent model; self-focusing; single mode power; spatial hole burning; stability; temperature rise; two-dimensional wave equation;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:19951658
Filename
363577
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