• DocumentCode
    1242727
  • Title

    Simulation of enhanced plasma effect wavelength tunable lasers

  • Author

    Suzuki, N. ; Morinaga, M.

  • Author_Institution
    Mater. & Devices Res. Labs., Toshiba Corp., Kawasaki, Japan
  • Volume
    142
  • Issue
    1
  • fYear
    1995
  • fDate
    2/1/1995 12:00:00 AM
  • Firstpage
    55
  • Lastpage
    60
  • Abstract
    The enhanced plasma effect (EPE) laser is a novel tunable multiquantum well (MQW) distributed feedback (DFB) laser with a thick reservoir layer between p-cladding and MQW layers. Performance of the EPE laser has been simulated by LDSCOPE (laser diode simulator by self-consistent opto-electronic model). Fast wave length shift due to the plasma effect is enhanced by increased carrier density change in the reservoir owing to the carrier transport effect. The calculated threshold and FM efficiency are in good accordance with those obtained experimentally. Calculated results suggest that a tuning range over 2.5 nm due to the plasma effect would have been obtained in the fabricated EPE laser with a 0.6 μm reservoir for the bias current range below 300 mA if it had not been for leakage current. A reservoir thicker than the diffusion length does not lead to a wider tuning range, because of carrier recombination in the reservoir. A thin barrier layer inserted between the reservoir and the MQW layer, however, will improve the carrier distribution in the reservoir, so that the tuning range may be expanded by 20%
  • Keywords
    distributed feedback lasers; laser tuning; quantum well lasers; 300 mA; FM efficiency; MQW layers; bias current range; carrier density change; carrier distribution; carrier recombination; carrier transport effect; diffusion length; enhanced plasma effect wavelength tunable laser; laser diode simulator by self-consistent opto-electronic model; leakage current; p-cladding; plasma effect; tunable multiquantum well distributed feedback laser; tuning range; wave length shift;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:19951669
  • Filename
    363581