• DocumentCode
    1242867
  • Title

    Finite-Difference Modeling of Dielectric Waveguides With Corners and Slanted Facets

  • Author

    Chiou, Yih-Peng ; Chiang, Yen-Chung ; Lai, Chih-Hsien ; Du, Cheng-Han ; Chang, Hung-chun

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    27
  • Issue
    12
  • fYear
    2009
  • fDate
    6/15/2009 12:00:00 AM
  • Firstpage
    2077
  • Lastpage
    2086
  • Abstract
    With the help of an improved finite-difference (FD) formulation, we investigate the field behaviors near the corners of simple dielectric waveguides and the propagation characteristics of a slant-faceted polarization converter. The formulation is full-vectorial, and it takes into consideration discontinuities of fields and their derivatives across the abrupt interfaces. Hence, the limitations in conventional FD formulation are alleviated. In the first investigation, each corner is replaced with a tiny arc rather than a really sharp wedge, and nonuniform grids are adopted. Singularity-like behavior of the electric fields emerge as the arc becomes smaller without specific treatment such as quasi-static approximation. Convergent results are obtained in the numerical analysis as compared with results from the finite-element method. In the second investigation, field behaviors across the slanted facet are incorporated in the formulation, and hence the staircase approximation in conventional FD formulation is removed to get better modeling of the full-vectorial properties.
  • Keywords
    finite difference methods; optical waveguide theory; dielectric waveguide; finite-difference modeling; full-vectorial property; nonuniform grid; quasistatic approximation; slant-faceted polarization converter; staircase approximation; Corners; dielectric waveguides; finite-difference method (FDM); frequency-domain analysis; full-vectorial; singularities; step index; tiny arcs;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.2006862
  • Filename
    4815483