DocumentCode :
1242868
Title :
Frequency normalization of constant power contours for MESFETs
Author :
Mondal, J.P.
Author_Institution :
General Electric Co., Syracuse, NY, USA
Volume :
36
Issue :
6
fYear :
1988
fDate :
6/1/1988 12:00:00 AM
Firstpage :
1107
Lastpage :
1110
Abstract :
The constant power contours have been measured on MESFETs with different doping profiles over the frequency range 8-16 GHz for a fixed input power level at different bias points. At each frequency, the contours are normalized with respect to the load for maximum power output; within experimental accuracy, the normalization holds fairly well, independent of frequency under certain limits. The concept is an extension of small-signal mismatch circles. In case of large-signal applications, the mismatch contours are no longer circles, because of the way the saturation current and breakdown voltage limits are attained. The contours present some reflection coefficient loci with respect to a given load
Keywords :
S-parameters; Schottky gate field effect transistors; doping profiles; power transistors; solid-state microwave devices; 8 to 16 GHz; MESFETs; S-parameters measurement; SHF; constant power contours; doping profiles; large-signal applications; microwave power transistors; mismatch contours; reflection coefficient loci; Admittance; Electromagnetic scattering; Electromagnetic waveguides; Equations; Equivalent circuits; Frequency measurement; MESFETs; Phase measurement; Power measurement; Reflection;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.3642
Filename :
3642
Link To Document :
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