Nanodots-induced pinning centers in thin films: effects on critical current density, activation energy and flux jump rate

By very short time rf sputtering in certain deposition conditions we have grown three-dimensional Ag nanodots on the substrate prior to the growth of Tl-based superconducting films. These nanodots create pinning centers, leading to an increase in the critical current density about 10 times. From the frequency dependence of the critical current density we estimated also the activation energy for the flux jumps, which resulted to be several times higher. The rate of the thermally-activated flux jumps decreases several orders of magnitude. We suggest that our method can be used for the reduction of thermal noise in high-T_c dc SQUID´s.