• DocumentCode
    1243034
  • Title

    Carrier trapping in inter-polysilicon charge injectors

  • Author

    Brown, D.R. ; Collins, S. ; Marshall, G.F.

  • Author_Institution
    Defence Res. Agency, Malvern, UK
  • Volume
    31
  • Issue
    1
  • fYear
    1995
  • fDate
    1/5/1995 12:00:00 AM
  • Firstpage
    72
  • Lastpage
    73
  • Abstract
    The authors report the observation of trapping and aging effects in charge injection schemes for floating-gate devices. The observations indicate that these polysilicon charge injectors must be used in conjunction with a programming technique which includes feedback. A suitable scheme is chip-in-the-loop training
  • Keywords
    ageing; charge-coupled devices; electron traps; elemental semiconductors; feedback; silicon; Si; aging; carrier trapping; chip-in-the-loop training; feedback; floating-gate devices; inter-polysilicon charge injectors; programming;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19950032
  • Filename
    364305
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1243034