DocumentCode
1243132
Title
Solving functional postfabrication tuning of circuits with symmetry problems by introducing an additional feature to neural network learning
Author
Liu, P.C.K. ; Li, K.C.
Volume
31
Issue
1
fYear
1995
fDate
1/5/1995 12:00:00 AM
Firstpage
27
Lastpage
29
Abstract
The authors define a new parameter, the combined improvement figure (IM), which is used with backpropagation neural network learning, and provides better discrimination in postfabrication tuning of circuits with symmetry property problems. Results from examples show that there is a substantial improvement in identifying correct tuning parameter and tuning levels when this figure is included
Keywords
backpropagation; circuit analysis computing; circuit tuning; electronic equipment manufacture; neural nets; symmetry; backpropagation neural network learning; circuits; combined improvement figure; functional postfabrication tuning; symmetry;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19950019
Filename
364319
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