• DocumentCode
    1243132
  • Title

    Solving functional postfabrication tuning of circuits with symmetry problems by introducing an additional feature to neural network learning

  • Author

    Liu, P.C.K. ; Li, K.C.

  • Volume
    31
  • Issue
    1
  • fYear
    1995
  • fDate
    1/5/1995 12:00:00 AM
  • Firstpage
    27
  • Lastpage
    29
  • Abstract
    The authors define a new parameter, the combined improvement figure (IM), which is used with backpropagation neural network learning, and provides better discrimination in postfabrication tuning of circuits with symmetry property problems. Results from examples show that there is a substantial improvement in identifying correct tuning parameter and tuning levels when this figure is included
  • Keywords
    backpropagation; circuit analysis computing; circuit tuning; electronic equipment manufacture; neural nets; symmetry; backpropagation neural network learning; circuits; combined improvement figure; functional postfabrication tuning; symmetry;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19950019
  • Filename
    364319