DocumentCode :
1243132
Title :
Solving functional postfabrication tuning of circuits with symmetry problems by introducing an additional feature to neural network learning
Author :
Liu, P.C.K. ; Li, K.C.
Volume :
31
Issue :
1
fYear :
1995
fDate :
1/5/1995 12:00:00 AM
Firstpage :
27
Lastpage :
29
Abstract :
The authors define a new parameter, the combined improvement figure (IM), which is used with backpropagation neural network learning, and provides better discrimination in postfabrication tuning of circuits with symmetry property problems. Results from examples show that there is a substantial improvement in identifying correct tuning parameter and tuning levels when this figure is included
Keywords :
backpropagation; circuit analysis computing; circuit tuning; electronic equipment manufacture; neural nets; symmetry; backpropagation neural network learning; circuits; combined improvement figure; functional postfabrication tuning; symmetry;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19950019
Filename :
364319
Link To Document :
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