• DocumentCode
    1243456
  • Title

    Functional approach to built-in selftest of integrated digital filters

  • Author

    Cambon, G.

  • Volume
    27
  • Issue
    25
  • fYear
    1991
  • Firstpage
    2326
  • Lastpage
    2327
  • Abstract
    A new functional approach to the built-in selftest of integrated digital filter is proposed. The test patterns depend on the transfer function, and are independent of the filter implementation. An example illustrates the method, and shows that the stuck-at fault coverage obtained with a simple and short term patterns is about 98%.
  • Keywords
    VLSI; built-in self test; digital filters; BIST; built-in selftest; example; functional approach; integrated digital filters; short term patterns; stuck-at fault coverage; test patterns; transfer function;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19911440
  • Filename
    121340
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1243456