The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs

Author

Lesea, Austin ; Drimer, Saar ; Fabula, Joseph J. ; Carmichael, Carl ; Alfke, Peter

Author_Institution

Xilinx, San Jose, CA, USA

Volume

5

Issue

3

fYear

2005

Firstpage

317

Lastpage

328

Abstract

Results are presented from real-time experiments that evaluated large field programmable gate arrays (FPGAs) fabricated in different CMOS technologies (0.15 μm, 0.13 μm, and 90 nm) for their sensitivity to radiation-induced single-event upsets (SEUs). These results are compared to circuit simulation (Qcrit) studies as well as to Los Alamos Neutron Science Center (LANSCE) neutron beam results and Crocker Nuclear Laboratory (University of California, Davis) cyclotron proton beam results.

Keywords

CMOS integrated circuits; circuit simulation; field programmable gate arrays; integrated circuit testing; logic testing; neutron effects; proton effects; 0.13 micron; 0.15 micron; 90 nm; CMOS; FPGA; Los Alamos Neutron Science Center; Rosetta experiment; SRAM; atmospheric soft error rate testing; circuit simulation; cosmic rays; cyclotron proton beam; field programmable gate arrays; neutron beam; radiation induced single event upsets; CMOS technology; Circuit simulation; Circuit testing; Cyclotrons; Error analysis; Field programmable gate arrays; Laboratories; Neutrons; Particle beams; Single event transient; Cosmic rays; FPGA; NSEU; SRAM; single-event upset; soft error;

fLanguage

English

Journal_Title

Device and Materials Reliability, IEEE Transactions on

Publisher

ieee

ISSN

1530-4388

Type

jour

DOI

10.1109/TDMR.2005.854207

Filename

1545892