Title :
1000-V, 30-A 4H-SiC BJTs with high current gain
Author :
Krishnaswami, Sumi ; Agarwal, Anant ; Ryu, Sei-Hyung ; Capell, Craig ; Richmond, James ; Palmour, John ; Balachandran, Santosh ; Chow, T. Paul ; Bayne, Stephen ; Geil, Bruce ; Jones, Kenneth ; Scozzie, Charles
Author_Institution :
Cree Inc., Durham, NC, USA
fDate :
3/1/2005 12:00:00 AM
Abstract :
This paper presents the development of 1000 V, 30A bipolar junction transistor (BJT) with high dc current gain in 4H-SiC. BJT devices with an active area of 3×3 mm2 showed a forward on-current of 30 A, which corresponds to a current density of 333 A/cm2, at a forward voltage drop of 2 V. A common-emitter current gain of 40, along with a low specific on-resistance of 6.0mΩ·cm2 was observed at room temperature. These results show significant improvement over state-of-the-art. High temperature current-voltage characteristics were also performed on the large-area bipolar junction transistor device. A collector current of 10A is observed at VCE=2 V and IB=600 mA at 225°C. The on-resistance increases to 22.5 mΩ·cm2 at higher temperatures, while the dc current gain decreases to 30 at 275°C. A sharp avalanche behavior was observed at a collector voltage of 1000 V. Inductive switching measurements at room temperature with a power supply voltage of 500 V show fast switching with a turn-off time of about 60 ns and a turn-on time of 32 ns, which is a result of the low resistance in the base.
Keywords :
bipolar transistor switches; power bipolar transistors; silicon compounds; wide band gap semiconductors; 1000 V; 225 C; 275 C; 30 A; 4H-SiC; 500 V; SiC; bipolar junction transistor; common-emitter current gain; current density; dc current gain; forward on-current; forward voltage drop; high temperature current-voltage characteristics; inductive switching measurements; specific on-resistance; Current density; Current measurement; Electrical resistance measurement; Gain measurement; Laboratories; MOSFETs; Power measurement; Silicon carbide; Temperature measurement; Voltage; 4H-SiC; current gain; high-speed switching; power BJT;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2004.842731