DocumentCode :
1244787
Title :
Modeling of MODFETs
Author :
Salmer, Georges ; Zimmermann, Jacques ; Fauquembergue, Renaud
Author_Institution :
Univ. des Sci. et Tech. de Lille-Flandres-Artois, Villeneuve d´´Ascq, France
Volume :
36
Issue :
7
fYear :
1988
fDate :
7/1/1988 12:00:00 AM
Firstpage :
1124
Lastpage :
1140
Abstract :
Accurate modeling of MODFETs and of certain novel structures recently proposed requires that a number of physical phenomena occurring in these devices be considered. Among these, some electron dynamic properties of the two-dimensional gas, the influence of deep levels of the doped AlGaAs layers, and the influence of the source parasitic access impedance are reviewed. The presently available models can roughly be sorted into three classes: the particle or Monte Carlo models, the two-dimensional solving methods of semiconductor equations, and the simpler one-dimensional or analytical models. After a brief review of the physical bases on which the models rely, their main capabilities and ranges of applicability are discussed. Some conclusions are drawn as to the effort which must be developed in the near future to improve MODFET modeling. It is recommended that simulations of devices such as SISFETs, multichannel structures, and pseudomorphic AlGaAs/InGaAs transistors be undertaken
Keywords :
Monte Carlo methods; high electron mobility transistors; semiconductor device models; 1D models; 2D models; AlGaAs; AlGaAs-InGaAs; MODFETs; Monte Carlo models; SISFETs; analytical models; electron dynamic properties; influence of deep levels; modeling; multichannel structures; physical phenomena; pseudomorphic transistors; ranges of applicability; source parasitic access impedance; two-dimensional gas; two-dimensional solving methods; Analytical models; Electrons; Equations; FETs; Gallium arsenide; HEMTs; Heterojunctions; Impedance; Indium gallium arsenide; Integrated circuit modeling; MODFET circuits; MODFETs; Microwave devices; Monte Carlo methods;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.3647
Filename :
3647
Link To Document :
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