Title :
Thermal impedance extraction for bipolar transistors
Author :
Zweidinger, David T. ; Fox, Robert M. ; Brodsky, Jonathan S. ; Jung, Taewon ; Lee, Sang-Gug
Author_Institution :
Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
fDate :
2/1/1996 12:00:00 AM
Abstract :
This paper describes a method for extracting the thermal impedance of bipolar transistors. The measurement is a two-step process: first the fractional temperature coefficients are calibrated at dc and then a transient step response is measured to extract the thermal spreading impedance. Measurement configurations and an example measurement cycle are shown. The measurement results can be fitted to multiple-pole models for use in compact circuit modeling in SPICE
Keywords :
bipolar transistors; DC calibration; SPICE; bipolar transistors; circuit modeling; fractional temperature coefficients; multiple-pole models; thermal impedance; thermal spreading impedance; transient step response; two-step measurement; Bipolar transistors; Current measurement; Electrical resistance measurement; Impedance; Steady-state; Temperature control; Thermal conductivity; Thermal resistance; Virtual colonoscopy; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
