DocumentCode
1245151
Title
Effects of the parasitics on the time response of RCE-PDs
Author
El-Batawy, Yasser M. ; Deen, M. Jamal
Author_Institution
Electr. & Comput. Eng. Dept., McMaster Univ., Hamilton, Ont., Canada
Volume
52
Issue
3
fYear
2005
fDate
3/1/2005 12:00:00 AM
Firstpage
325
Lastpage
334
Abstract
Resonant cavity enhanced photodetectors (RCE-PDs) are promising candidates for applications in high-speed optical communications and interconnections. However, because parasitics effects of these high-speed photodetectors can significantly degrade the performance of the photodetector, then they must be carefully considered. Here, an accurate model for the time response of the RCE-PDs that includes the effects of their parasitics is presented. The effects of an inductor that may be added in series with the load resistor are also studied and it is shown that the external inductor can improve the performance of the photodetector because it compensates some of the degradations resulting from capacitive parasitics. The effects of the parasitics have been investigated for different dimensions of the photodetectors, different values of both the load resistance and the added inductor and also for different multiplication gains for the case of RCE-avalanche photodetectors.
Keywords
avalanche photodiodes; cavity resonators; equivalent circuits; inductors; optical communication equipment; photodetectors; resistors; semiconductor device models; RCE-avalanche photodetectors; capacitive parasitics; high-speed interconnections; high-speed optical communications; high-speed photodetectors; inductor; load resistor; parasitics effects; photodetector circuit model; physics-based modeling; resonant cavity enhanced photodetectors; time response; Absorption; Charge carrier processes; Distributed Bragg reflectors; High speed optical techniques; Inductors; Optical refraction; Optical saturation; Optical variables control; Photodetectors; Time factors; Circuit model of photodetectors; RCE photodetectors; high-speed photodetectors; parasitics in photodetectors; photodetectors; physics-based modeling; time response;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2005.843885
Filename
1397981
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