• DocumentCode
    1245178
  • Title

    Asymmetric halo CMOSFET to reduce static power dissipation with improved performance

  • Author

    Bansal, Aditya ; Roy, Kaushik

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    52
  • Issue
    3
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    397
  • Lastpage
    405
  • Abstract
    In this paper, we show the benefits of using asymmetric halo (AH, different source, and drainside halo doping concentrations) MOSFETs over conventional symmetric halo (SH) MOSFETs to reduce static leakage in sub-50-nm CMOS circuits. Device doping profiles have been optimized to achieve minimum leakage at iso on-current. Results show a 61% reduction in static leakage in AH nMOS transistor and a 90% reduction in static leakage in AH pMOS transistor because of reduced band-to-band tunneling current in the reverse biased drain-substrate junctions. In an AH CMOS inverter, static power dissipation is 19% less than in an SH CMOS inverter. Propagation delay in a three-stage ring oscillator reduces by 11% because of reduced drainside halo doping and hence reduced drain junction capacitance. Further comparisons have been made on two-input NAND and NOR CMOS logic gates.
  • Keywords
    CMOS logic circuits; MOSFET; doping profiles; leakage currents; tunnelling; AH nMOS transistor; AH pMOS transistor; CMOS circuits; CMOS inverter; CMOS logic gates; NAND logic gate; NOR logic gate; asymmetric halo CMOSFET; doping profiles; drain junction capacitance; drainside halo doping concentrations; halo implants; process variations; propagation delay; reduced band-to-band tunneling current; reverse biased drain-substrate junctions; ring oscillator; static leakage reduction; static power dissipation reduction; sub-50-nm gate lengths; CMOS logic circuits; CMOSFETs; Capacitance; Doping profiles; Inverters; MOSFETs; Power dissipation; Propagation delay; Ring oscillators; Tunneling; Band-to-band tunneling; MOSFET; NAND gate; NOR gate; halo implants; process variations;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.843969
  • Filename
    1397990