Title :
Asymmetric halo CMOSFET to reduce static power dissipation with improved performance
Author :
Bansal, Aditya ; Roy, Kaushik
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fDate :
3/1/2005 12:00:00 AM
Abstract :
In this paper, we show the benefits of using asymmetric halo (AH, different source, and drainside halo doping concentrations) MOSFETs over conventional symmetric halo (SH) MOSFETs to reduce static leakage in sub-50-nm CMOS circuits. Device doping profiles have been optimized to achieve minimum leakage at iso on-current. Results show a 61% reduction in static leakage in AH nMOS transistor and a 90% reduction in static leakage in AH pMOS transistor because of reduced band-to-band tunneling current in the reverse biased drain-substrate junctions. In an AH CMOS inverter, static power dissipation is 19% less than in an SH CMOS inverter. Propagation delay in a three-stage ring oscillator reduces by 11% because of reduced drainside halo doping and hence reduced drain junction capacitance. Further comparisons have been made on two-input NAND and NOR CMOS logic gates.
Keywords :
CMOS logic circuits; MOSFET; doping profiles; leakage currents; tunnelling; AH nMOS transistor; AH pMOS transistor; CMOS circuits; CMOS inverter; CMOS logic gates; NAND logic gate; NOR logic gate; asymmetric halo CMOSFET; doping profiles; drain junction capacitance; drainside halo doping concentrations; halo implants; process variations; propagation delay; reduced band-to-band tunneling current; reverse biased drain-substrate junctions; ring oscillator; static leakage reduction; static power dissipation reduction; sub-50-nm gate lengths; CMOS logic circuits; CMOSFETs; Capacitance; Doping profiles; Inverters; MOSFETs; Power dissipation; Propagation delay; Ring oscillators; Tunneling; Band-to-band tunneling; MOSFET; NAND gate; NOR gate; halo implants; process variations;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2005.843969