DocumentCode :
1245382
Title :
Nanoscale Design & Test Challenges
Author :
Zorian, Yervant
Author_Institution :
Virage Logic Corp.
Volume :
38
Issue :
2
fYear :
2005
Firstpage :
36
Lastpage :
39
Abstract :
The silicon-scaling revolution presents a plethora of challenges as technology progresses into the nanoscale era. To meet these challenges, the design and test community has banded together to improve design automation and find solutions that will optimize performance at every level.
Keywords :
Automatic testing; Companies; Costs; Design automation; Design optimization; Electronic design automation and methodology; Intellectual property; Marine vehicles; Process design; Protection;
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/MC.2005.67
Filename :
1401770
Link To Document :
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