Title :
Robust system design with built-in soft-error resilience
Author :
Mitra, Subhasish ; Seifert, Norbert ; Zhang, Ming ; Shi, Quan ; Kim, Kee Sup
Abstract :
Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system´s susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors.
Keywords :
SRAM chips; clocks; design for testability; fault tolerance; flip-flops; logic design; logic testing; system-on-chip; SRAM chips; built-in soft-error resilience; clocks; design-for-testability; flip-flops; logic design; logic testing; robust system design; terrestrial radiation; transient errors; Circuit testing; Computer errors; Flip-flops; Life estimation; Logic design; Network servers; Particle beams; Protection; Resilience; Robustness;
