Title :
Experimental results on buried microstrip lines for constructing high-density microwave integrated circuits
Author :
Ishikawa, Takahide ; Yamashita, Eikichi
Author_Institution :
Optoelectron. & Microwave Devices R&D Lab., Mitsubishi Electr. Corp., Hyogo, Japan
fDate :
12/1/1995 12:00:00 AM
Abstract :
This letter describes the characterization and some experimental results of a buried microstrip line (BMSL), a guided-wave structure considered to be promising for constructing high-density microwave and millimeter-wave integrated circuits because of its high isolation characteristics. The BMSL structure is characterized practically by the rectangular boundary division (RED) method and rigorously by the finite difference time domain (FDTD) method. The analyzed results reveal that the BMSL structure possesses much lower coupling level than the conventional microstrip line does, from -15 to -100 dB depending on their burial depth. Experimental data show good agreement with numerical results
Keywords :
finite difference time-domain analysis; microstrip circuits; microstrip lines; microwave integrated circuits; buried microstrip lines; coupling level; finite difference time domain method; guided-wave structure; high-density microwave integrated circuits; isolation; rectangular boundary division method; Conducting materials; Conductors; Coupling circuits; Dielectric constant; Dielectric materials; Dielectric substrates; Finite difference methods; Microstrip; Strips; Time domain analysis;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
