DocumentCode :
1245585
Title :
Design and analysis of dual-rail circuits for security applications
Author :
Sokolov, Danil ; Murphy, Julian ; Bystrov, Alexander ; Yakovlev, Alex
Author_Institution :
Sch. of Electr. Electron. & Comput. Eng., Newcastle Univ., Newcastle upon Tyne, UK
Volume :
54
Issue :
4
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
449
Lastpage :
460
Abstract :
Dual-rail encoding, return-to-spacer protocol, and hazard-free logic can be used to resist power analysis attacks by making energy consumed per clock cycle independent of processed data. Standard dual-rail logic uses a protocol with a single spacer, e.g., all-zeros, which gives rise to energy balancing problems. We address these problems by incorporating two spacers; the spacers alternate between adjacent clock cycles. This guarantees that all gates switch in every clock cycle regardless of the transmitted data values. To generate these dual-rail circuits, an automated tool has been developed. It is capable of converting synchronous netlists into dual-rail circuits and it is interfaced to industry CAD tools. Dual-rail and single-rail benchmarks based upon the advanced encryption standard (AES) have been simulated and compared in order to evaluate the method and the tool.
Keywords :
circuit CAD; circuit analysis computing; circuit layout CAD; cryptography; logic CAD; logic circuits; CAD tool; advanced encryption standard; cryptography; design automation; dual-rail encoding circuits; energy balancing problem; hardware security; hazard-free logic; power analysis; return-to-spacer protocol; security applications; Circuit analysis; Circuit simulation; Clocks; Cryptography; Data security; Encoding; Logic; Protocols; Resists; Switches; Index Terms- Alternating spacer protocol; cryptography; design automation; dual-rail encoding; hardware security; hazard-free design; power analysis.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2005.61
Filename :
1401864
Link To Document :
بازگشت